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A TEM within a TEM – Optimizing Electron-Optical Beam Paths for Time-Resolved Methods
Researcher: Dr. Tolga Wagner, Humboldt-Universität zu Berlin, Institut für Physik (contact: tolga.wagner@hu-berlin.de)
Measuring facility: Institute of Optics and Atomic Physics, Electron- and Ion-Nanooptics (TU Berlin)
Project Overview:
This project focused on designing and optimizing electron-optical beam paths to enable time-resolved and phase-resolving imaging using transmission electron microscopy (TEM). By utilizing the FEI 80-300 Titan TEM at Technische Universität Berlin as a testing platform, the team successfully developed beam configurations and imaging modes transferable to the Jeol JEM-2200FS TEM at HU Berlin.
Key Outcomes:
- Creation of modular and adaptable beam paths for time-resolved electron microscopy across different TEM instruments.
- Demonstrated the feasibility of replicating beam paths between systems from different manufacturers.
- Generated preliminary results supporting a joint DFG proposal for advanced phase-resolving imaging techniques.
Significance:
This work paves the way for implementing time-resolved methods on a variety of TEMs and setups, making cutting-edge imaging techniques more accessible and versatile. Supported by the ACEM, this project highlights how early-career researchers can drive technological advancements in electron microscopy and develop solutions to complex imaging challenges.